We gratefully acknowledge the Office of Naval Research for support of this work. J. K. S. acknowledges an IBM Manufacturing Research Fellowship. We also acknowledge Professor Li Sun (University of Minnesota) for providing important technical and theoretical insights.
Scanning probe surface modification†
Article first published online: 29 OCT 2004
Copyright © 1993 Verlag GmbH & Co. KGaA, Weinheim
Volume 5, Issue 12, pages 935–938, December 1993
How to Cite
Corbitt, T. S., Crooks, R. M., Ross, C. B., Hampden-Smith, M. J. and Schoer, J. K. (1993), Scanning probe surface modification. Adv. Mater., 5: 935–938. doi: 10.1002/adma.19930051213
- Issue published online: 29 OCT 2004
- Article first published online: 29 OCT 2004
Nanometer-scale manipulation of surfaces by scanning probe devices has expanded amazingly since the first reports in the mid-1980s. General approaches to scanning probe microscope induced surface patterning are discussed. The Figure shows a scanning electron micrograph of an STM-defined pattern of a HS(CH2)17CH3 monolayer resist on a Au(111) substrate.