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Advanced Materials

Scanning probe microscopy study of the incommensurate modulation and surface defects in the layered telluride TaGe0.355Te2

Authors

  • Dr. Hardy Bengel,

    1. Materials Research Center (FMF), Albert Ludwigs University Stefan-Meier-Strasse 31 A, D-79104 Freiburg (PRG)
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  • Prof. Hans-Joachim Cantow,

    1. Materials Research Center (FMF), Albert Ludwigs University Stefan-Meier-Strasse 31 A, D-79104 Freiburg (PRG)
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  • Dr. Sergei N. Magonov,

    Corresponding author
    1. Materials Research Center (FMF), Albert Ludwigs University Stefan-Meier-Strasse 31 A, D-79104 Freiburg (PRG)
    • Materials Research Center (FMF), Albert Ludwigs University Stefan-Meier-Strasse 31 A, D-79104 Freiburg (PRG)
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  • Dr. Laure Monconduit,

    1. Laboratoire de Chimie de Solides. Insitut des Materinux de Nantes UMR CNRS No. 110, Université de Nantes F-44072 Nantes Cedex 03 (France)
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  • Dr. Michel Evain,

    1. Laboratoire de Chimie de Solides. Insitut des Materinux de Nantes UMR CNRS No. 110, Université de Nantes F-44072 Nantes Cedex 03 (France)
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  • Dr. Weigen Liang,

    1. Department of Chemistry, North Carolina State University Raleigh, NC 27695-8204 (USA)
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  • Prof. Myung-Hwan Whangho

    1. Department of Chemistry, North Carolina State University Raleigh, NC 27695-8204 (USA)
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  • The work at North Carolina State University was supported by the Office of Basic Energy Sciences, Division of Materials Science, U. S. Department of Energy, under Grant DE-FG05-86ER45259.

Abstract

The detection of atomic-size defects by atomic force microscopy (AFM) is demonstrated. For example, the dark grooves in the image of the surface of the incommensurate layered telluride phase TaGe0.355Te2 (see Figure) indicate a defect. The origin of this incommensurate structure of layered tellurides is established and it is shown that high applied forces enhance the image contrast in AFM.

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