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The tomographic atom probe: New dimensions in materials analysis

Authors

  • Dr. Bernard Deconoihout,

    Corresponding author
    1. Lahoratoire de Microscopic lonique, URA. CNRS 808 Facultè des Sciences, Université de Rouen Place Emile Blondel, F-76821 Mont-Saint-Aignan Cedex (France)
    • Lahoratoire de Microscopic lonique, URA. CNRS 808 Facultè des Sciences, Université de Rouen Place Emile Blondel, F-76821 Mont-Saint-Aignan Cedex (France)
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  • Dr. Sylvain Chambreland,

    1. Lahoratoire de Microscopic lonique, URA. CNRS 808 Facultè des Sciences, Université de Rouen Place Emile Blondel, F-76821 Mont-Saint-Aignan Cedex (France)
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  • Prof. Didier Blavette

    1. Lahoratoire de Microscopic lonique, URA. CNRS 808 Facultè des Sciences, Université de Rouen Place Emile Blondel, F-76821 Mont-Saint-Aignan Cedex (France)
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Abstract

The tomographic atom prob (TAP) is the most advanced of the three-dimemsional atom probes currently in use. Atom probes are unique in that both the lateral and the depth resolution are high. The genera; development of atom probes and the principle of operation ot the TAP, in which the sample is field evaporated atomic loayer by atomic layer, are outlined. The analysis of a nickel base superalloy is given as an example of an application in metallurgy.

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