We wish to acknowledge H. Ahari, C. L. Bowes, T. Jiang, A. J. Lough, and D. Young from the University of Toronto for the synthesis and characterization of the materials an for helpful discussions. The financial support of the Canadian Space Agency, the Natural sciences and Engineering Research Council of Canada (NSERC), and UOP, Tarrytown, NY is greatly appreciated. The AFM was purchased with a generous NSERC equipment grant to GSH
Imaging the surfaces of nanoporous semiconductors by atomic force microscopy†
Version of Record online: 15 SEP 2004
Copyright © 1995 Verlag GmbH & Co. KGaA, Weinheim
Volume 7, Issue 1, pages 64–68, January 1995
How to Cite
Enzel, P., Henderson, G. S., Ozin, G. A. and Bedard, R. L. (1995), Imaging the surfaces of nanoporous semiconductors by atomic force microscopy. Adv. Mater., 7: 64–68. doi: 10.1002/adma.19950070115
- Issue online: 15 SEP 2004
- Version of Record online: 15 SEP 2004
- Manuscript Revised: 26 AUG 1994
- Manuscript Received: 24 MAY 1994
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