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Rectifying properties and photoconductivity of tetraruthenated nickel porphyrin films†

  1. Prof. Koiti Araki,
  2. Lúcio Angnes,
  3. Henrique E. Toma

Article first published online: 15 SEP 2004

DOI: 10.1002/adma.19950070609

Issue

Advanced Materials

Advanced Materials

Volume 7, Issue 6, pages 554–559, June 1995

Additional Information

How to Cite

Araki, K., Angnes, L. and Toma, H. E. (1995), Rectifying properties and photoconductivity of tetraruthenated nickel porphyrin films. Adv. Mater., 7: 554–559. doi: 10.1002/adma.19950070609

Author Information

  1. Instituto de Quimica, Universidade de Sao Paulo, Caixa Postal 26077, CEP 05599-970, Sao Paulo, SP (Brazil)

  1. †

    Financial support from PADCT, CNPq and FAPESP is gratefully acknowledged.

Publication History

  1. Issue published online: 15 SEP 2004
  2. Article first published online: 15 SEP 2004
  3. Manuscript Revised: 2 FEB 1995
  4. Manuscript Received: 24 OCT 1994

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Oxidation-state selective modified electrodes based on tetraruthenated nickel porphyrin (see Figure) thin films are reported. The films are prepared by dip coating and are highly homogeneous and adherent, exhibiting a well-controlled electrochemical and photoelectrochemical response. The films simulate a rectifying junction.

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