Gaetano Granozzi is Full Professor of Inorganic Chemistry in the Department of Inorganic, Metallorganic and Analytical Chemistry of the University of Padova. He is currently the Director of the Research Unit of the Consortium INCM at te University of Padova. He is autor of over 150 papers in the following fields: Electronic structure of mono- and polynuclear inorganic and organometallic molecules by quantum mechanical calculations and spectroscopic measurements (1976–1988); Surface chemistry of materials and chemisorption studied by srface-sensitive spectroscopic measurements (since 1987); Thin film deposition and characterization (since 1989). His current main interests are in the growth mechanism and structure of ultrathin epitaxial films.
Angle-Scanned Photoelectron Diffraction: Probing crystalline ultrathin films†
Article first published online: 29 OCT 2004
Copyright © 1996 Verlag GmbH & Co. KGaA, Weinheim
Volume 8, Issue 4, pages 315–326, April 1996
How to Cite
Granozzi, G. and Sambi, M. (1996), Angle-Scanned Photoelectron Diffraction: Probing crystalline ultrathin films. Adv. Mater., 8: 315–326. doi: 10.1002/adma.19960080407
We thank Prof. C. S. Fadley (University of California, Davis and Lawrence Berkeley Laboratory) for critically reading the manuscript and for his many valuable comments and suggestions. We thank Prof. Ugo Bardi and Dr. Monica Galeotti (University of Firenze) for providing original data on the Co/Pt(111) system. Thanks are due also to the whole group of the Surface Science and Thin Film Laboratory of the University of Padova, and in particular to Prof. Eugenio Tondello for his encouragement in the implementation of the XPD technique
- Issue published online: 29 OCT 2004
- Article first published online: 29 OCT 2004
- Manuscript Received: 16 JAN 1996
Electrons emitted from the core levels of a photon-irradiated crystalline sample undergo scattering by atoms in the vicinity of the emitting species. Subsequent interference phenomena between the electron wave portions propagating to the detector produce intensity modulations as a function of the direction of detection. This process constitutes the physical basis of the angle-scanned X-ray photoelectron diffraction (XPD) technique. The resulting modulations, properly interpreted, are rich in structural information concerning the near-surface atomic layers. In this review, after an introduction to the principles of XPD, some selected results in the field of ultrathin epitaxial films will be reported in order to outline the merits of the technique. Qualitative structural information (e. g., growth modes and lattice distortions) is directly obtained from the experimental raw data without the need for theoretical simulation. On the other hand, quantitative structural parameters, as well as the presence of stacking faults and other structural defects, may be deduced by using a trial-and-error fitting procedure based on simple scattering models.