Molecular surface orientation field of a langmuir monolayer determined by second-harmonic microscopy

Authors

  • Dr. Mathias Flörsheimer,

    Corresponding author
    1. University of Münster Wilhelm-Klemm-Strasse 10 D-48149 Münster (Germany)
    • University of Münster Wilhelm-Klemm-Strasse 10 D-48149 Münster (Germany)
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  • Heiner Salmen,

    1. University of Münster Wilhelm-Klemm-Strasse 10 D-48149 Münster (Germany)
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  • Martin Bösch,

    1. University of Münster Wilhelm-Klemm-Strasse 10 D-48149 Münster (Germany)
    Current affiliation:
    1. Nonlinear Optics Laboratory, Institute of Quantum Electronics, Swiss Federal Institute of Technology, ETH-Hönggerberg, CH-8093 Zürich, Switzerland
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  • Christof Brillert,

    1. University of Münster Wilhelm-Klemm-Strasse 10 D-48149 Münster (Germany)
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  • Maria Wierschem,

    1. University of Münster Wilhelm-Klemm-Strasse 10 D-48149 Münster (Germany)
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  • Prof. Harald Fuchs

    Corresponding author
    1. University of Münster Wilhelm-Klemm-Strasse 10 D-48149 Münster (Germany)
    • University of Münster Wilhelm-Klemm-Strasse 10 D-48149 Münster (Germany)
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  • Financial support from the Federal Ministry for Science and Research of Northrhine Westfalia and from the Volkswagen foundation is gratefully acknowledged.

Abstract

The characterization of a Langmuir monolayer at a water surface by means of second-harmonic microscopy (SHM) is reported. Details of the technique and the theory are presented in the following article. The application described here illustrates the main advantages of SHM: it provides quantitative information on the microscopic level and reveals additional information compared to linear microscopy techniques. It is demonstrated to open up new perspectives for the development and improvement of polar organic materials, starting from polar monolayers at an interface.

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