Part of this work was financially supported by the Netherlands Technology Foundation (STW).
Communication
Si-Compatible Ion-Selective Oxide Interconnects with High Tunability†
Article first published online: 17 JUN 2004
DOI: 10.1002/adma.200306660
Copyright © 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Additional Information
How to Cite
Schmuhl, R., Sekulic, J., Roy Chowdhury, S., van Rijn, C. J. M., Keizer, K., van den Berg, A., ten Elshof, J. E. and Blank, D. H. A. (2004), Si-Compatible Ion-Selective Oxide Interconnects with High Tunability. Adv. Mater., 16: 900–904. doi: 10.1002/adma.200306660
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Publication History
- Issue published online: 17 JUN 2004
- Article first published online: 17 JUN 2004
- Manuscript Accepted: 13 FEB 2004
- Manuscript Received: 19 DEC 2003
- Abstract
- References
- Cited By
Keywords:
- Alumina;
- Porous materials;
- Silica;
- Titania
A new class of porous oxide interconnects with a regularly perforated SiN support structure is presented here. The method is demonstrated by constructing γ-alumina, MCM-48 silica (see Figure), and amorphous titania interconnects. Ionic transport through the gate is established by externally varying the potential difference across the interconnects, which allows cationic, anionic, or no transport, depending on the magnitude and sign of the applied potential difference.

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