G. A. O. is Government of Canada Research Chair in Materials Chemistry. He is deeply grateful to the Natural Sciences and Engineering Council of Canada for financial support of this work. D. D. P. gratefully acknowledges financial support from the Canadian Institute for Advanced Research (CIAR). G. v. F. acknowledges support through the Deutsche Forschungsgemeinschaft (DFG) under FR1671/2-1.
Buried Linear Extrinsic Defects in Colloidal Photonic Crystals†
Article first published online: 3 MAY 2005
Copyright © 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Volume 17, Issue 10, pages 1269–1272, May, 2005
How to Cite
Vekris, E., Kitaev, V., von Freymann, G., Perovic, D. D., Aitchison, J. S. and Ozin, G. A. (2005), Buried Linear Extrinsic Defects in Colloidal Photonic Crystals. Adv. Mater., 17: 1269–1272. doi: 10.1002/adma.200401764
- Issue published online: 3 MAY 2005
- Article first published online: 3 MAY 2005
- Manuscript Accepted: 12 JAN 2005
- Manuscript Received: 27 OCT 2004
- Lithography, photo-;
- Photonic crystals, collodial;
Linear extrinsic defects can be embedded inside the lattice of a silica colloidal photonic-crystal film via a directed self-assembly strategy involving a combination of top–down photolithography and bottom–up colloidal assembly. High-spatial-resolution scanning micro-optical spectroscopy proves to be an effective means of characterizing the photonic crystal properties of the buried defects (see Figure) within the film.