Intrinsic Ferroelectric Properties of Strained Tetragonal PbZr0.2Ti0.8O3 Obtained on Layer–by–Layer Grown, Defect–Free Single–Crystalline Films


  • The work has been partly funded by Volkswagen Foundation, through the “Nanosized ferroelectric hybrids” project no. I/80897. Sincere thanks to S. Reyntjens and E. Sourty, both from FEI Application Laboratory (Eindhoven/NL), for the FIB preparation and STEM investigation, respectively, to N. D. Zakharov for HRTEM investigations, to S. Swatek for the TEM sample preparation, and N. Schammelt for assistance in the PLD system maintenance.


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Ferroelectric single–crystalline PbZr0.2Ti0.8O3 thin films, free from extended defects, are grown by pulsed laser deposition onto vicinal SrTiO3(001) single crystals. The PbZr0.2Ti0.8O3 films are strained and exhibit enhanced tetragonality, c/a ≈ 1.06. They have a remnant polarization, Pr ≈ 110 μC cm–2, dielectric constant, ϵ33 ≈ 90, and piezoelectric coefficient, d33, up to 50 pm V–1 (see figure).