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Keywords:

  • Polymers;
  • Polymers, semiconducting;
  • Semiconductors
Thumbnail image of graphical abstract

A method for determining the electron/hole transport length scale of model semiconducting polymer systems by scanning a narrow-light probe beam over the nonoverlapping anode/cathode region in asymmetric sandwich device structures is presented (see figure). Electron versus hole collection efficacy, and disorder and spatial anisotropy in the electrical transport parameters can be estimated.