High Throughput Surface Characterisation of a Combinatorial Material Library


  • The authors thank Dr. F. J. Rutten and Ms E. Smith for their help with ToF-SIMS and XPS respectively. Dr. J. G. Frerichs at Kruss for support with the DSA 100. This work was supported by the BBSRC grant no. BB/C516379/1 and NIH grant no. R01 DE016516. Supporting Information is available online from Wiley InterScience or from the authors.


original image

The figure shows a schematic representing the information that can be obtained from the surface of each polymer sample within the microarrayed library. High throughput surface analytical techniques used include X-ray photoelectron spectroscopy, time-of-flight secondary ion mass spectrometry and water contact angle measurement.