S. C. C. and J. S. L. contributed equally to this work. This study was supported principally by a Creative Research Initiative (Functionally Integrated Oxide Heterostructures) from the Korean Ministry of Science and Technology (MOST) and the Korea Science and Engineering Foundation (KOSEF), and in part by Samsung Electronics. B. K. and J. S. L were supported by the KOSEF grant funded by the MOST (No.R17-2007-073-01001-0). H. S. and S. K. would like to thank the Center for Materials and Processes of Self-assembly (R11-2005-048-00000-0) and National Research Lab (R0A-2007-000-20105-0) Program in the MOST/KOSEF ERC program. Supporting Information is available from Wiley InterScience or from the author.
Random Circuit Breaker Network Model for Unipolar Resistance Switching†
Version of Record online: 7 MAR 2008
Copyright © 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Volume 20, Issue 6, pages 1154–1159, March 18, 2008
How to Cite
Chae, S. C., Lee, J. S., Kim, S., Lee, S. B., Chang, S. H., Liu, C., Kahng, B., Shin, H., Kim, D.-W., Jung, C. U., Seo, S., Lee, M.-J. and Noh, T. W. (2008), Random Circuit Breaker Network Model for Unipolar Resistance Switching. Adv. Mater., 20: 1154–1159. doi: 10.1002/adma.200702024
- Issue online: 19 MAR 2008
- Version of Record online: 7 MAR 2008
- Manuscript Revised: 16 OCT 2007
- Manuscript Received: 13 AUG 2007
- KOSEF grant funded by the MOST. Grant Number: R17-2007-073-01001-0
Supporting information for this article is available on the WWW under http://www.wiley-vch.de/contents/jc_2089/2008/adma200702024_s.pdf or from the author.
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