Scanning Photoemission Microscopy of Graphene Sheets on SiO2

Authors


  • This work was supported by the Nuclear R&D programs funded by the Ministry of Science and Technology (MOST) of Korea (grant no. MOST-2007-01156), the Center of Fusion Technology for Security, the SRC program (Center for Nanotubes and Nanostructured Composites) of MOST/KOSEF (grant no. R11-2001-00002-0), Brain Korea 21 Project (KRF-2006-312-C00565) the national R&D Projects for Nano Science and Technology Korea Research (grant no. KRF-2005-070-C00063), a Korea Research Foundation Grant funded by the Korean Government (MOEHRD) (KRF-2006-311-C00307), and the experiments at PLS were supported in part by MOST and POSTECH. One of the authors (H.L.) was supported by grant No R01-2006-000-11247 from the Basic Research Program of KOSEF.

Abstract

original image

Scanning photoemission microscopy (SPEM) images of a graphene flake as well as the C 1s core level spectra for the mono- and multilayer graphene are measured. The samples with lateral dimensions on the micrometer scale are prepared on a SiO2 surface by direct exfoliation of crystalline graphite. Monolayer graphene is distinguished from the multilayer graphens through the chemical contrast images of SPEM.

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