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Keywords:

  • charge transport;
  • field-effect transistors;
  • organic;
  • scanning kelvin probe microscopy;
  • semiconductors;
  • solution processing
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Scanning Kelvin probe microscopy (SKPM) of functioning solution processed thin film transistors is used to correlate film microstructure with device performance. As the channel length increases in these spun–cast devices, significant changes occur in the film microstructure within the device channel. These changes are observed with SKPM, and show a strong structure–function relationship.