The authors thank Y. Liang and Y. Xia for useful discussion and some technical support. This work was supported primarily by the University of Minnesota Materials Research Science and Engineering Center, funded by the NSF (DMR-0212302), and also partly through DMR-0706011. Parts of this work were carried out in the Institute of Technology Characterization Facility, University of Minnesota, which receives partial support from NSF through the NNIN program. Supporting Information is available online from Wiley InterScience or from the author.
Grain Orientation Mapping of Polycrystalline Organic Semiconductor Films by Transverse Shear Microscopy†
Version of Record online: 22 SEP 2008
Copyright © 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Volume 20, Issue 21, pages 4033–4039, November 3, 2008
How to Cite
Kalihari, V., Tadmor, E. B., Haugstad, G. and Frisbie, C. D. (2008), Grain Orientation Mapping of Polycrystalline Organic Semiconductor Films by Transverse Shear Microscopy. Adv. Mater., 20: 4033–4039. doi: 10.1002/adma.200801834
- Issue online: 29 OCT 2008
- Version of Record online: 22 SEP 2008
- Manuscript Received: 1 JUL 2008
- NSF. Grant Number: DMR-0212302
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