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Advanced Materials

Carbon-Nanotube-Based Electrical Brush Contacts

Authors

  • Geza Toth,

    1. Microelectronics and Materials Physics Laboratories Department of Electrical and Information Engineering University of Oulu, P.O. Box 4500 Oulu, Finland
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  • Jani Mäklin,

    1. Microelectronics and Materials Physics Laboratories Department of Electrical and Information Engineering University of Oulu, P.O. Box 4500 Oulu, Finland
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  • Niina Halonen,

    1. Microelectronics and Materials Physics Laboratories Department of Electrical and Information Engineering University of Oulu, P.O. Box 4500 Oulu, Finland
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  • Jaakko Palosaari,

    1. Microelectronics and Materials Physics Laboratories Department of Electrical and Information Engineering University of Oulu, P.O. Box 4500 Oulu, Finland
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  • Jari Juuti,

    1. Microelectronics and Materials Physics Laboratories Department of Electrical and Information Engineering University of Oulu, P.O. Box 4500 Oulu, Finland
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  • Heli Jantunen,

    1. Microelectronics and Materials Physics Laboratories Department of Electrical and Information Engineering University of Oulu, P.O. Box 4500 Oulu, Finland
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  • Krisztian Kordas,

    1. Microelectronics and Materials Physics Laboratories Department of Electrical and Information Engineering University of Oulu, P.O. Box 4500 Oulu, Finland
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  • W. Gregory Sawyer,

    1. Department of Mechanical and Aerospace Engineering University of Florida, Gainesville, FL 32611 USA
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  • Robert Vajtai,

    Corresponding author
    1. Department of Mechanical Engineering and Materials Science Rice University, Houston, TX 77005 USA
    • Department of Mechanical Engineering and Materials Science Rice University, Houston, TX 77005 USA.
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  • Pulickel M. Ajayan

    1. Department of Mechanical Engineering and Materials Science Rice University, Houston, TX 77005 USA
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Abstract

Electrical properties of brush contacts made of bulk carbon nanotube forest are significantly better than the presently used commercial products due to the unique and intimate surface interaction of the former on the nanoscale. The image displays the nanotube block used, the measurement setup, and the resistance fluctuations for the carbon nanotube and the conventional brush setups.

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