Inside Front Cover

Scanning Probe Microscopy: Electrical Scanning Probe Microscopy on Active Organic Electronic Devices (Adv. Mater. 1/2009)

  1. Liam S. C. Pingree,
  2. Obadiah G. Reid,
  3. David S. Ginger*

Article first published online: 2 JAN 2009

DOI: 10.1002/adma.200890111

Issue

Advanced Materials

Advanced Materials

Volume 21, Issue 1, page n/a, January 5, 2009

Additional Information

How to Cite

Pingree, L. S. C., Reid, O. G. and Ginger, D. S. (2009), Scanning Probe Microscopy: Electrical Scanning Probe Microscopy on Active Organic Electronic Devices (Adv. Mater. 1/2009). Advanced Materials, 21: n/a. doi: 10.1002/adma.200890111

Author Information

  1. Department of Chemistry, University of Washington P. O. Box 351700, Seattle, WA 98195-1700 (USA)

*Department of Chemistry, University of Washington P. O. Box 351700, Seattle, WA 98195-1700 (USA).

Publication History

  1. Issue published online: 2 JAN 2009
  2. Article first published online: 2 JAN 2009

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Keywords:

  • OLEDs;
  • Charge traps;
  • Electroluminescence;
  • Organic photovoltaics;
  • Organic field-effect transistors

Graphical Abstract

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The inside cover, drawn by Irene Wang, illustrates that electrical atomic force microscopy techniques can play an integral part in the research and development of organic electronic materials. On p. 19 Pingree, Reid, and Ginger highlight the use of scanning probe microscopy techniques in examining heterogeneities, defects, and various transport properties including injection, trapping, and generation/recombination in organic lightemitting diodes, thin-film transistors, and solar cells.

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