Three-dimensional Electrical Property Mapping with Nanometer Resolution
Article first published online: 3 SEP 2009
Copyright © 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Volume 21, Issue 48, pages 4915–4919, December 28, 2009
How to Cite
Alekseev, A., Efimov, A., Lu, K. and Loos, J. (2009), Three-dimensional Electrical Property Mapping with Nanometer Resolution. Adv. Mater., 21: 4915–4919. doi: 10.1002/adma.200901754
- Issue published online: 21 DEC 2009
- Article first published online: 3 SEP 2009
- Manuscript Received: 26 MAY 2009
- Ministry of Economic Affairs of the Netherlands by the Technologische Samenwerkings project QUANAP (SenterNovem TSGE3108)
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