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Advanced Materials

Thermally Induced Failure of Polymer Dielectrics

Authors

  • Ross S. Johnson,

    1. Organic Materials Department Sandia National Laboratories P.O. Box 5800, Albuquerque, New Mexico 87185 (USA)
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  • Kirsten N. Cicotte,

    1. Organic Materials Department Sandia National Laboratories P.O. Box 5800, Albuquerque, New Mexico 87185 (USA)
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  • Patrick J. Mahoney,

    1. Electronic and Nanostructured Materials Department Sandia National Laboratories P.O. Box 5800, Albuquerque, New Mexico 87185 (USA)
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  • Bruce A. Tuttle,

    1. Electronic and Nanostructured Materials Department Sandia National Laboratories P.O. Box 5800, Albuquerque, New Mexico 87185 (USA)
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  • Shawn M. Dirk

    Corresponding author
    1. Organic Materials Department Sandia National Laboratories P.O. Box 5800, Albuquerque, New Mexico 87185 (USA)
    • Organic Materials Department Sandia National Laboratories P.O. Box 5800, Albuquerque, New Mexico 87185 (USA).
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Abstract

Halogen precursor polymers to poly[(2,3-diphenyl-p-phenylene)vinylene] (DP-PPV) are examined for use as advanced capacitor dielectrics. The polymer is demonstrated to function as a good dielectric until it reaches a set temperature determined by the stability of the leaving groups. Conjugation of the polymer backbone at high temperature effectively disables the capacitor, providing a ‘built-in’ safety mechanism for electronic devices. Conducting Polymers.

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