Determination of Electronic Structure of Oxide–Oxide Interfaces by Photoemission Spectroscopy
Version of Record online: 13 APR 2010
Copyright © 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Special Issue: Yale's Center for Research on Interface Structure and Phenomena
Volume 22, Issue 26-27, pages 2950–2956, July 20, 2010
How to Cite
Wang, H.-Q., Altman, E., Broadbridge, C., Zhu, Y. and Henrich, V. (2010), Determination of Electronic Structure of Oxide–Oxide Interfaces by Photoemission Spectroscopy. Adv. Mater., 22: 2950–2956. doi: 10.1002/adma.200903759
- Issue online: 21 JUL 2010
- Version of Record online: 13 APR 2010
- Manuscript Received: 4 NOV 2010
Options for accessing this content:
- If you are a society or association member and require assistance with obtaining online access instructions please contact our Journal Customer Services team.
- If your institution does not currently subscribe to this content, please recommend the title to your librarian.
- Login via other institutional login options http://onlinelibrary.wiley.com/login-options.
- You can purchase online access to this Article for a 24-hour period (price varies by title)
- If you already have a Wiley Online Library or Wiley InterScience user account: login above and proceed to purchase the article.
- New Users: Please register, then proceed to purchase the article.
Login via OpenAthens
Search for your institution's name below to login via Shibboleth.
Registered Users please login:
- Access your saved publications, articles and searches
- Manage your email alerts, orders and subscriptions
- Change your contact information, including your password
Please register to:
- Save publications, articles and searches
- Get email alerts
- Get all the benefits mentioned below!