Communication
Depletion of PCBM at the Cathode Interface in P3HT/PCBM Thin Films as Quantified via Neutron Reflectivity Measurements
Article first published online: 20 MAY 2010
DOI: 10.1002/adma.200903971
Copyright © 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Additional Information
How to Cite
Parnell, A. J., Dunbar, A. D. F., Pearson, A. J., Staniec, P. A., Dennison, A. J. C., Hamamatsu, H., Skoda, M. W. A., Lidzey, D. G. and Jones, Richard. A. L. (2010), Depletion of PCBM at the Cathode Interface in P3HT/PCBM Thin Films as Quantified via Neutron Reflectivity Measurements. Adv. Mater., 22: 2444–2447. doi: 10.1002/adma.200903971
Publication History
- Issue published online: 2 JUN 2010
- Article first published online: 20 MAY 2010
- Manuscript Received: 11 NOV 2009
Funded by
- UK EPSRC. Grant Number: EP/F016433/1
- EPSRC. Grant Number: EP/E046215/1
Keywords:
- P3HT;
- PCBM;
- bulk heterojunctions;
- phase separations;
- polymer solar cells;
- morphologies

Using neutron reflectivity, self-stratification in a model P3HT/PCBM blend is observed. The as-spun and solvent-annealed films show a depletion of PCBM near the top surface and enrichment of PCBM at the substrate (see figure). Depletion of PCBM at the cathode interface in a photovoltaic device could act as a barrier to efficient electron extraction. On thermal annealing, the PCBM depleted region is eliminated; an effect that partially explains the improvement of P3HT/PCBM devices on thermal annealing.

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