Review
Crystalline Oxides on Silicon
Article first published online: 28 APR 2010
DOI: 10.1002/adma.200904306
Copyright © 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Issue

Advanced Materials
Special Issue: Yale's Center for Research on Interface Structure and Phenomena
Volume 22, Issue 26-27, pages 2919–2938, July 20, 2010
Additional Information
How to Cite
Reiner, J. W., Kolpak, A. M., Segal, Y., Garrity, K. F., Ismail-Beigi, S., Ahn, C. H. and Walker, F. J. (2010), Crystalline Oxides on Silicon. Adv. Mater., 22: 2919–2938. doi: 10.1002/adma.200904306
Publication History
- Issue published online: 21 JUL 2010
- Article first published online: 28 APR 2010
- Manuscript Received: 15 DEC 2009
- Abstract
- Article
- References
- Cited By
Keywords:
- epitaxy;
- ferroics;
- field‒effect transistors;
- structure‒property relationships
Abstract
This review outlines developments in the growth of crystalline oxides on the ubiquitous silicon semiconductor platform. The overall goal of this endeavor is the integration of multifunctional complex oxides with advanced semiconductor technology. Oxide epitaxy in materials systems achieved through conventional deposition techniques is described first, followed by a description of the science and technology of using atomic layer-by-layer deposition with molecular beam epitaxy (MBE) to systematically construct the oxide–silicon interface. An interdisciplinary approach involving MBE, advanced real-space structural characterization, and first-principles theory has led to a detailed understanding of the process by which the interface between crystalline oxides and silicon forms, the resulting structure of the interface, and the link between structure and functionality. Potential applications in electronics and photonics are also discussed.

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