Three-Dimensional Carrier Profiling of Individual Si Nanowires by Scanning Spreading Resistance Microscopy
Article first published online: 16 AUG 2010
Copyright © 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Volume 22, Issue 36, pages 4020–4024, September 22, 2010
How to Cite
Ou, X., Kanungo, P. D., Kögler, R., Werner, P., Gösele, U., Skorupa, W. and Wang, X. (2010), Three-Dimensional Carrier Profiling of Individual Si Nanowires by Scanning Spreading Resistance Microscopy. Adv. Mater., 22: 4020–4024. doi: 10.1002/adma.201001086
- Issue published online: 16 SEP 2010
- Article first published online: 16 AUG 2010
- Manuscript Revised: 25 MAR 2010
- Manuscript Received: 21 DEC 2009
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