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Keywords:

  • growth processes;
  • molecular orientation;
  • thin films;
  • X-ray photoelectron spectroscopy (XPS)
Thumbnail image of graphical abstract

Highly resolved spectromicroscopy reveals that characteristics like electronic structure, core-hole screening, and molecular orientation depend on the local morphology of the thin films. These phenomena, like different screening of the core hole, or different FWHM of the XPS lines, have been previously shown comparing different samples consisting of monolayers and multilayers. On the contrary, in our work we show their occurrence comparing islands versus monolayers in the same film.