Revealing Buried Interfaces to Understand the Origins of Threshold Voltage Shifts in Organic Field-Effect Transistors
Article first published online: 21 SEP 2010
Copyright © 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Volume 22, Issue 45, pages 5105–5109, December 1, 2010
How to Cite
Mathijssen, S. G. J., Spijkman, M.-J., Andringa, A.-M., van Hal, P. A., McCulloch, I., Kemerink, M., Janssen, R. A. J. and de Leeuw, D. M. (2010), Revealing Buried Interfaces to Understand the Origins of Threshold Voltage Shifts in Organic Field-Effect Transistors. Adv. Mater., 22: 5105–5109. doi: 10.1002/adma.201001865
- Issue published online: 30 NOV 2010
- Article first published online: 21 SEP 2010
- Manuscript Revised: 29 JUL 2010
- Manuscript Received: 20 MAY 2010
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