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Keywords:

  • SrTiO3;
  • Resistive Switching;
  • Conductive AFM;
  • Thin Films;
  • Data Storage;
  • Memristors
Thumbnail image of graphical abstract

Conductive atomic force microscopy combined with a delamination technique is used to remove the top electrode of Fe-doped SrTiO3 metal–insulator–metal structures and gain insight into the active switching interface. Both a filamentary and an area-dependent switching process with opposite switching polarities are found in the same sample.