Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods
Version of Record online: 11 NOV 2010
Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Volume 23, Issue 4, pages 477–501, January 25, 2011
How to Cite
Barth, C., Foster, A. S., Henry, C. R. and Shluger, A. L. (2011), Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods. Adv. Mater., 23: 477–501. doi: 10.1002/adma.201002270
- Issue online: 21 JAN 2011
- Version of Record online: 11 NOV 2010
- Manuscript Revised: 20 AUG 2010
- Manuscript Received: 23 JUN 2010
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