Get access
Advanced Materials

Surface Potential Mapping of SAM-Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy

Authors

  • David J. Ellison,

    1. Department of Chemical Engineering and Materials Science, University of Minnesota, 151 Amundson Hall, 421 Washington Avenue SE, Minneapolis, MN 55455, USA
    Search for more papers by this author
  • Bumsu Lee,

    1. Physics Department, Rutgers University, Piscataway, NJ 08854, USA
    Search for more papers by this author
  • V. Podzorov,

    1. Physics Department, Rutgers University, Piscataway, NJ 08854, USA
    Search for more papers by this author
  • C. Daniel Frisbie

    Corresponding author
    1. Department of Chemical Engineering and Materials Science, University of Minnesota, 151 Amundson Hall, 421 Washington Avenue SE, Minneapolis, MN 55455, USA
    • Department of Chemical Engineering and Materials Science, University of Minnesota, 151 Amundson Hall, 421 Washington Avenue SE, Minneapolis, MN 55455, USA.
    Search for more papers by this author

Abstract

Kelvin probe force microscopy measurements on rubrene single crystals partially coated with fluorinated and non-fluorinated SAM derivatives are employed to determine the SAM-induced surface potentials caused by an interfacial charge-transfer doping process resulting in an interface dipole. The surface potential and topographic information in turn allow calculation of the effective intramolecular electric fields and carrier densities due to doping in the SAM-modified rubrene crystals.

original image
Get access to the full text of this article

Ancillary