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Ultrahigh Strain Hardening in Thin Palladium Films with Nanoscale Twins

Authors

  • Hosni Idrissi,

    Corresponding author
    1. EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerpen, Belgium
    • EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerpen, Belgium.
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  • Binjie Wang,

    1. EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerpen, Belgium
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  • Marie Stéphane Colla,

    1. Institute of Mechanics, Materials and Civil Engineering, Université catholique de Louvain 2, place du Levant, B-1348 Louvain-la-Neuve, Belgium
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  • Jean Pierre Raskin,

    1. Department of Electrical Engineering, Université catholique de Louvain 3, place du Levant B-1348 Louvain-la-Neuve, Belgium
    2. CeRMiN, Research Center in Micro and Nanoscopic Materials and Electronic Devices, Université catholique de Louvain 3, place du Levant, B-1348 Louvain-la-Neuve, Belgium
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  • Dominique Schryvers,

    1. EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerpen, Belgium
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  • Thomas Pardoen

    1. Institute of Mechanics, Materials and Civil Engineering, Université catholique de Louvain 2, place du Levant, B-1348 Louvain-la-Neuve, Belgium
    2. CeRMiN, Research Center in Micro and Nanoscopic Materials and Electronic Devices, Université catholique de Louvain 3, place du Levant, B-1348 Louvain-la-Neuve, Belgium
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Abstract

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Nanocrystalline Pd thin films containing coherent growth twin boundaries are deformed using on-chip nanomechanical testing. A large work-hardening capacity is measured. The origin of the observed behavior is unraveled using transmission electron microscopy and shows specific dislocations and twin boundaries interactions. The results indicate the potential for large strength and ductility balance enhancement in Pd films, as needed in membranes for H technologies.

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