Advanced Materials

Complex Oxide Interfaces: Determination of Electronic Structure of Oxide–Oxide Interfaces by Photoemission Spectroscopy (Adv. Mater. 26–27/2010)

Authors

  • Hui-Qiong Wang,

    1. Center for Research on Interface Structures and Phenomena, Department of Applied Physics, Yale University, New Haven, CT 06520 (USA)
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  • Eric Altman,

    1. Center for Research on Interface Structures and Phenomena, Department of Chemical Engineering, Yale University, New Haven, CT 06520 (USA)
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  • Christine Broadbridge,

    1. Center for Research on Interface Structures and Phenomena, Department of Physics, Southern Connecticut State University, New Haven, CT 06515 (USA)
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  • Yimei Zhu,

    1. Center for Research on Interface Structures and Phenomena, Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY 11973 (USA)
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  • Victor Henrich

    Corresponding author
    1. Center for Research on Interface Structures and Phenomena, Department of Applied Physics, Yale University, New Haven, CT 06520 (USA)
    • Center for Research on Interface Structures and Phenomena, Department of Applied Physics, Yale University, New Haven, CT 06520 (USA).
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Abstract

Precise understanding of structure – property relationships at interfaces is critical for electronic devices, particularly at the nanometer scale, and can be achieved by a synergy of high-quality growth, advanced characterization, and first principles theory (on page 2950).

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