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Keywords:

  • complex oxide multilayers;
  • interfaces;
  • focused ion-beam milling;
  • scanning probe microscopy
Thumbnail image of graphical abstract

The La0.65Sr0.35MnO3 (LSM)/SrTi0.2Fe0.8O3 (STF) multilayer is observed using scanning probe microscopy following a focused-ion beam milling process with shallow incidence angle. Although the nominal thickness of each layer is about 5 nm, the exposed layers are magnified by several orders of magnitude on the surface after FIB cutting. This procedure enables high spatial resolution and coordinated property measurements directly on the inner layers and at their interfaces.