Direct Probing of Nanodimensioned Oxide Multilayers with the Aid of Focused Ion Beam Milling
Version of Record online: 8 SEP 2011
Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Volume 23, Issue 39, pages 4543–4548, October 18, 2011
How to Cite
Kuru, Y., Jalili, H., Cai, Z., Yildiz, B. and Tuller, H. L. (2011), Direct Probing of Nanodimensioned Oxide Multilayers with the Aid of Focused Ion Beam Milling. Adv. Mater., 23: 4543–4548. doi: 10.1002/adma.201102401
- Issue online: 13 OCT 2011
- Version of Record online: 8 SEP 2011
- Manuscript Revised: 27 JUL 2011
- Manuscript Received: 24 JUN 2011
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