Communication

Autonomic Restoration of Electrical Conductivity

  1. Benjamin J. Blaiszik1,
  2. Sharlotte L. B. Kramer1,
  3. Martha E. Grady2,
  4. David A. McIlroy1,
  5. Jeffrey S. Moore3,
  6. Nancy R. Sottos1,*,
  7. Scott R. White4,*

Article first published online: 20 DEC 2011

DOI: 10.1002/adma.201102888

Issue

Advanced Materials

Advanced Materials

Volume 24, Issue 3, pages 398–401, January 17, 2012

Additional Information

How to Cite

Blaiszik, B. J., Kramer, S. L. B., Grady, M. E., McIlroy, D. A., Moore, J. S., Sottos, N. R. and White, S. R. (2012), Autonomic Restoration of Electrical Conductivity. Adv. Mater., 24: 398–401. doi: 10.1002/adma.201102888

Author Information

  1. 1

    Department of Materials Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 1304 W. Green St. Urbana, IL 61801, USA

  2. 2

    Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, 1206 W. Green St. Urbana, IL 61801, USA

  3. 3

    Department of Chemistry, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 505 S. Mathews St. Urbana, IL 61801, USA

  4. 4

    Department of Aerospace Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 104 S. Wright St. Urbana, IL 61801, USA

*Department of Materials Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 1304 W. Green St. Urbana, IL 61801, USA

Publication History

  1. Issue published online: 10 JAN 2012
  2. Article first published online: 20 DEC 2011
  3. Manuscript Revised: 30 OCT 2011
  4. Manuscript Received: 27 JUL 2011

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Keywords:

  • stimuli-responsive materials;
  • self-healing materials;
  • microelectronics;
  • electrical conductivity
Thumbnail image of graphical abstract

Self-healing of an electrical circuit is demonstrated with nearly full recovery of conductance less than one millisecond after damage. Crack damage breaks a conductive pathway in a multilayer device, interrupting electron transport and simultaneously rupturing adjacent microcapsules containing gallium–indium liquid metal (top). The released liquid metal flows to the area of damage, restoring the conductive pathway (bottom).

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