Advanced Materials

Autonomic Restoration of Electrical Conductivity

Authors

  • Benjamin J. Blaiszik,

    1. Department of Materials Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 1304 W. Green St. Urbana, IL 61801, USA
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  • Sharlotte L. B. Kramer,

    1. Department of Materials Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 1304 W. Green St. Urbana, IL 61801, USA
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  • Martha E. Grady,

    1. Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, 1206 W. Green St. Urbana, IL 61801, USA
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  • David A. McIlroy,

    1. Department of Materials Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 1304 W. Green St. Urbana, IL 61801, USA
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  • Jeffrey S. Moore,

    1. Department of Chemistry, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 505 S. Mathews St. Urbana, IL 61801, USA
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  • Nancy R. Sottos,

    Corresponding author
    1. Department of Materials Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 1304 W. Green St. Urbana, IL 61801, USA
    • Department of Materials Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 1304 W. Green St. Urbana, IL 61801, USA
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  • Scott R. White

    Corresponding author
    1. Department of Aerospace Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 104 S. Wright St. Urbana, IL 61801, USA
    • Department of Aerospace Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 104 S. Wright St. Urbana, IL 61801, USA.
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Abstract

Self-healing of an electrical circuit is demonstrated with nearly full recovery of conductance less than one millisecond after damage. Crack damage breaks a conductive pathway in a multilayer device, interrupting electron transport and simultaneously rupturing adjacent microcapsules containing gallium–indium liquid metal (top). The released liquid metal flows to the area of damage, restoring the conductive pathway (bottom).

original image

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