Communication
High Thermal Responsiveness of a Reduced Graphene Oxide Field-Effect Transistor
Article first published online: 18 JUL 2012
DOI: 10.1002/adma.201201724
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Additional Information
How to Cite
Trung, T. Q., Tien, N. T., Kim, D., Jung, J. H., Yoon, O. J. and Lee, N.-E. (2012), High Thermal Responsiveness of a Reduced Graphene Oxide Field-Effect Transistor. Adv. Mater., 24: 5254–5260. doi: 10.1002/adma.201201724
Publication History
- Issue published online: 25 SEP 2012
- Article first published online: 18 JUL 2012
- Manuscript Revised: 26 JUN 2012
- Manuscript Received: 29 APR 2012
Keywords:
- field-effect transistors;
- reduced graphene oxide;
- thermal responsiveness;
- sensors
A reduced graphene oxide field-effect transistor (R-GO FET) device has a uniform self-assembled and networked channel of R-GO nanosheets that are highly responsive to physical stimuli such as temperature variations and infrared irradiation. The charge-transport mechanisms of the networked R-GO thin film include charge tunneling through the nanosheet junction and charge-hopping transport. Under a thermal or infrared (IR) stimulus, the charge carriers generated by thermal or IR activation contribute to changes in the charge transport inside the networked R-GO thin film.

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