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Review

Advanced Electron Microscopy for Advanced Materials

  1. Gustaaf Van Tendeloo*,
  2. Sara Bals,
  3. Sandra Van Aert,
  4. Jo Verbeeck,
  5. Dirk Van Dyck

Article first published online: 21 AUG 2012

DOI: 10.1002/adma.201202107

Issue

Advanced Materials

Advanced Materials

Volume 24, Issue 42, pages 5655–5675, November 8, 2012

Additional Information

How to Cite

Van Tendeloo, G., Bals, S., Van Aert, S., Verbeeck, J. and Van Dyck, D. (2012), Advanced Electron Microscopy for Advanced Materials. Adv. Mater., 24: 5655–5675. doi: 10.1002/adma.201202107

Author Information

  1. Electron Microscopy for Materials Research (EMAT), University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium

*Electron Microscopy for Materials Research (EMAT), University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium.

Publication History

  1. Issue published online: 2 NOV 2012
  2. Article first published online: 21 AUG 2012
  3. Manuscript Received: 25 MAY 2012

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Keywords:

  • electron microscopy;
  • nanomaterials

Abstract

The idea of this Review is to introduce newly developed possibilities of advanced electron microscopy to the materials science community. Over the last decade, electron microscopy has evolved into a full analytical tool, able to provide atomic scale information on the position, nature, and even the valency atoms. This information is classically obtained in two dimensions (2D), but can now also be obtained in 3D. We show examples of applications in the field of nanoparticles and interfaces.

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