Correspondence

Comment on Real-Time Observation on Dynamic Growth/Dissolution of Conductive Filaments in Oxide-Electrolyte- Based ReRAM

  1. Ilia Valov1,2,*,
  2. Rainer Waser1

Article first published online: 22 OCT 2012

DOI: 10.1002/adma.201202592

Issue

Advanced Materials

Advanced Materials

Volume 25, Issue 2, pages 162–164, January 11, 2013

Additional Information

How to Cite

Valov, I. and Waser, R. (2013), Comment on Real-Time Observation on Dynamic Growth/Dissolution of Conductive Filaments in Oxide-Electrolyte- Based ReRAM. Adv. Mater., 25: 162–164. doi: 10.1002/adma.201202592

Author Information

  1. 1

    Institut für Werkstoffe der Elektrotechnik 2, RWTH Aachen University, 52074 Aachen, Germany

  2. 2

    Peter Grünberg Institute (Electronic Materials), Forschungszentrum Jülich, 52425 Jülich, Germany

*Institut für Werkstoffe der Elektrotechnik 2, RWTH Aachen University, 52074 Aachen, Germany.

Publication History

  1. Issue published online: 7 JAN 2013
  2. Article first published online: 22 OCT 2012
  3. Manuscript Revised: 27 JUL 2012
  4. Manuscript Received: 26 JUN 2012

SEARCH

SEARCH BY CITATION

ARTICLE TOOLS

View Full Article with Supporting Information (HTML) Get PDF (254K)

Keywords:

  • electronic devices;
  • nonvolatile memory;
  • ReRAM;
  • solid electrolytes

Abstract

Filament formation and dissolution in the system Ag(Cu)/ZrO2/Pt were observed by Liu et al. [Adv. Mater. 2012, 24, 1844]. Their explanation of the phenomena is shown here to be inappropriate. Various situations, including the “bipolar electrode” shown in the figure, are considered and the difference between the behavior in electrochemical metallization memories (ECMs) and valence change memories (VCMs) outlined. Of crucial importance for distinguishing ECM from VCM behavior, that is, the effects of cation and anion migration, is the choice of the solid materials used to transport metal cations. A possible explanation of the phenomena is proposed.

View Full Article with Supporting Information (HTML) Get PDF (254K)