For the PDPP3T/PCBM system investigated here, atomic force microscopy, resonant soft X-ray scattering, and grazing incidence wide angle X-ray scattering are used as an initial set of tools to determine the surface texture, the bulk compositional morphology, and the crystallization behavior, respectively. We find systematic variations and relate them to device performance. A solvent mixture of DCB/CF/DIO = 76:19:5 (v/v/v) yields a PCE of 6.71%.
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