SEARCH

SEARCH BY CITATION

Keywords:

  • electric-field screening;
  • MoS2;
  • two-dimensional crystals;
  • Thomas–Fermi theory;
  • electrostatic force microscopy (EFM)
Thumbnail image of graphical abstract

The electrostatic screening in single and few-layer MoS2 sheets is studied. Electrostatic force microscopy is used to probe the electric field generated by charge impurities in the substrate and incompletely screened by MoS2 sheets. A non-linear Thomas–Fermi theory is employed to interpret the experimental results, demonstrating the important role of the interlayer coupling in the screening of MoS2.