Response to “Comment on Real-Time Observation on Dynamic Growth/Dissolution of Conductive Filaments in Oxide-Electrolyte-Based ReRAM”
Article first published online: 19 OCT 2012
Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Volume 25, Issue 2, pages 165–167, January 11, 2013
How to Cite
Liu, Q., Jun, S., Lv, H., Long, S., Li, L., Yin, K., Wan, N., Li, Y., Sun, L. and Liu, M. (2013), Response to “Comment on Real-Time Observation on Dynamic Growth/Dissolution of Conductive Filaments in Oxide-Electrolyte-Based ReRAM”. Adv. Mater., 25: 165–167. doi: 10.1002/adma.201203771
- Issue published online: 7 JAN 2013
- Article first published online: 19 OCT 2012
- Manuscript Received: 10 SEP 2012
As a service to our authors and readers, this journal provides supporting information supplied by the authors. Such materials are peer reviewed and may be re-organized for online delivery, but are not copy-edited or typeset. Technical support issues arising from supporting information (other than missing files) should be addressed to the authors.
Please note: Wiley Blackwell is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.