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Keywords:

  • atomic force microscopy;
  • graphene;
  • mechanical properties;
  • nanoplatelets;
  • wrinkling
Thumbnail image of graphical abstract

Mapping the in-plane moduli: A simple wrinkling process on a deformable substrate requiring only readily available topographical atomic force microscopy (AFM) imaging allows space-resolved determination of the mechanical properties of single graphene oxide and chemically derived graphene sheets. The lateral resolution in the sub-micrometer range delivers unique insights into the defect distribution within the nanoplatelets.