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Space-Resolved In-Plane Moduli of Graphene Oxide and Chemically Derived Graphene Applying a Simple Wrinkling Procedure



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Mapping the in-plane moduli: A simple wrinkling process on a deformable substrate requiring only readily available topographical atomic force microscopy (AFM) imaging allows space-resolved determination of the mechanical properties of single graphene oxide and chemically derived graphene sheets. The lateral resolution in the sub-micrometer range delivers unique insights into the defect distribution within the nanoplatelets.

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