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Advanced Materials

Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization

Authors

  • M. Lanza,

    1. State Key Laboratory for Turbulence and Complex System, Department of Mechanics and Aerospace Engineering, CAPT, College of Engineering, Peking University, Beijing 100871, China
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  • A. Bayerl,

    1. Electronic Engineering Department, Universitat Autònoma de Barcelona, Campus de la UAB, Building Q, Cerdanyola del Vallès 08193, Spain
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  • T. Gao,

    1. Center for Nanochemistry (CNC), Beijing National Laboratory for Molecular Sciences, State Key Laboratory for Structural Chemistry of Unstable and Stable Species, College of Chemistry and Molecular Engineering, Academy for Advanced Interdisciplinary Studies, Peking University, Beijing 100871, China
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  • M. Porti,

    1. Electronic Engineering Department, Universitat Autònoma de Barcelona, Campus de la UAB, Building Q, Cerdanyola del Vallès 08193, Spain
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  • M. Nafria,

    1. Electronic Engineering Department, Universitat Autònoma de Barcelona, Campus de la UAB, Building Q, Cerdanyola del Vallès 08193, Spain
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  • G. Y. Jing,

    1. Physics Department, Northwest University, Xi'an 710069, China
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  • Y. F. Zhang,

    1. Center for Nanochemistry (CNC), Beijing National Laboratory for Molecular Sciences, State Key Laboratory for Structural Chemistry of Unstable and Stable Species, College of Chemistry and Molecular Engineering, Academy for Advanced Interdisciplinary Studies, Peking University, Beijing 100871, China
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  • Z. F. Liu,

    1. Center for Nanochemistry (CNC), Beijing National Laboratory for Molecular Sciences, State Key Laboratory for Structural Chemistry of Unstable and Stable Species, College of Chemistry and Molecular Engineering, Academy for Advanced Interdisciplinary Studies, Peking University, Beijing 100871, China
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  • H. L. Duan

    Corresponding author
    1. State Key Laboratory for Turbulence and Complex System, Department of Mechanics and Aerospace Engineering, CAPT, College of Engineering, Peking University, Beijing 100871, China
    • State Key Laboratory for Turbulence and Complex System, Department of Mechanics and Aerospace Engineering, CAPT, College of Engineering, Peking University, Beijing 100871, China.
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Abstract

Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip–sample interaction.

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