Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization
Version of Record online: 27 DEC 2012
Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Volume 25, Issue 10, pages 1440–1444, March 13, 2013
How to Cite
Lanza, M., Bayerl, A., Gao, T., Porti, M., Nafria, M., Jing, G. Y., Zhang, Y. F., Liu, Z. F. and Duan, H. L. (2013), Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization. Adv. Mater., 25: 1440–1444. doi: 10.1002/adma.201204380
- Issue online: 8 MAR 2013
- Version of Record online: 27 DEC 2012
- Manuscript Revised: 26 NOV 2012
- Manuscript Received: 21 OCT 2012
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