Highly Improved Uniformity in the Resistive Switching Parameters of TiO2 Thin Films by Inserting Ru Nanodots
Version of Record online: 6 FEB 2013
Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Volume 25, Issue 14, pages 1987–1992, April 11, 2013
How to Cite
Yoon, J. H., Han, J. H., Jung, J. S., Jeon, W., Kim, G. H., Song, S. J., Seok, J. Y., Yoon, K. J., Lee, M. H. and Hwang, C. S. (2013), Highly Improved Uniformity in the Resistive Switching Parameters of TiO2 Thin Films by Inserting Ru Nanodots. Adv. Mater., 25: 1987–1992. doi: 10.1002/adma.201204572
- Issue online: 8 APR 2013
- Version of Record online: 6 FEB 2013
- Manuscript Revised: 3 DEC 2012
- Manuscript Received: 5 NOV 2012
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