Advanced Materials

Self-Healing Circuits: Autonomic Restoration of Electrical Conductivity (Adv. Mater. 3/2012)

Authors

  • Benjamin J. Blaiszik,

    1. Department of Materials Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 1304 W. Green St. Urbana, IL 61801, USA
    Search for more papers by this author
  • Sharlotte L. B. Kramer,

    1. Department of Materials Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 1304 W. Green St. Urbana, IL 61801, USA
    Search for more papers by this author
  • Martha E. Grady,

    1. Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, 1206 W. Green St. Urbana, IL 61801, USA
    Search for more papers by this author
  • David A. McIlroy,

    1. Department of Materials Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 1304 W. Green St. Urbana, IL 61801, USA
    Search for more papers by this author
  • Jeffrey S. Moore,

    1. Department of Chemistry, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 505 S. Mathews St. Urbana, IL 61801, USA
    Search for more papers by this author
  • Nancy R. Sottos,

    Corresponding author
    1. Department of Materials Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 1304 W. Green St. Urbana, IL 61801, USA
    • Nancy R. Sottos, Department of Materials Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 1304 W. Green St. Urbana, IL 61801, USA

      Scott R. White, Department of Aerospace Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 104 S. Wright St. Urbana, IL 61801, USA.

    Search for more papers by this author
  • Scott R. White

    Corresponding author
    1. Department of Aerospace Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 104 S. Wright St. Urbana, IL 61801, USA
    • Nancy R. Sottos, Department of Materials Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 1304 W. Green St. Urbana, IL 61801, USA

      Scott R. White, Department of Aerospace Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 104 S. Wright St. Urbana, IL 61801, USA.

    Search for more papers by this author

Abstract

Self-healing of an electrical circuit is demonstrated by Nancy R. Sottos, Scott R. White, and co-workers on page 398 with nearly full recovery of conductance less than one millisecond after damage. Cracks break a conductive pathway in a multilayer device, interrupting electron transport and simultaneously rupturing adjacent microcapsules containing gallium–indium liquid metal. The released liquid metal restores the conductive pathway.

original image

Ancillary