Organic Semiconductors: Wide-Range Refractive Index Control of Organic Semiconductor Films Toward Advanced Optical Design of Organic Optoelectronic Devices (Adv. Mater. 47/2012)

Authors

  • Daisuke Yokoyama,

    Corresponding author
    1. Department of Organic Device Engineering and Research Center for Organic Electronics (ROEL), Yamagata University, 4-3-16 Johnan, Yonezawa, Yamagata 992-8510, Japan
    • Department of Organic Device Engineering and Research Center for Organic Electronics (ROEL), Yamagata University, 4-3-16 Johnan, Yonezawa, Yamagata 992-8510, Japan.
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  • Ken-ichi Nakayama,

    1. Department of Organic Device Engineering and Research Center for Organic Electronics (ROEL), Yamagata University, 4-3-16 Johnan, Yonezawa, Yamagata 992-8510, Japan
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  • Toshiya Otani,

    1. Department of Organic Device Engineering and Research Center for Organic Electronics (ROEL), Yamagata University, 4-3-16 Johnan, Yonezawa, Yamagata 992-8510, Japan
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  • Junji Kido

    1. Department of Organic Device Engineering and Research Center for Organic Electronics (ROEL), Yamagata University, 4-3-16 Johnan, Yonezawa, Yamagata 992-8510, Japan
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Abstract

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Over the past quarter century of organic semiconductor research, refractive index control of organic semiconductor thin films has never been discussed. Daisuke Yokoyama and co-workers demonstrate on page 6368 a large refractive index difference of 0.58 in organic semiconductor films and fabricated organic photoconductive DBRs (distributed Bragg reflectors) with a reflectivity of >98%. These findings provide us with new additional freedom and strategies in advanced optical design of organic semiconductor devices.

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