Transit Phenomena in Organic Field-Effect Transistors Through Kelvin-Probe Force Microscopy
Article first published online: 29 APR 2013
Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Special Issue: Organic and Hybrid Materials for Flexible Electronics
Volume 25, Issue 31, pages 4315–4319, August 21, 2013
How to Cite
Melzer, C., Siol, C. and von Seggern, H. (2013), Transit Phenomena in Organic Field-Effect Transistors Through Kelvin-Probe Force Microscopy. Adv. Mater., 25: 4315–4319. doi: 10.1002/adma.201300004
- Issue published online: 13 AUG 2013
- Article first published online: 29 APR 2013
- Manuscript Revised: 5 MAR 2013
- Manuscript Received: 1 JAN 2013
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