Ultrathin Limit of Exchange Bias Coupling at Oxide Multiferroic/Ferromagnetic Interfaces
Version of Record online: 12 JUL 2013
Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Volume 25, Issue 34, pages 4739–4745, September 14, 2013
How to Cite
Huijben, M., Yu, P., Martin, L. W., Molegraaf, H. J. A., Chu, Y.-H., Holcomb, M. B., Balke, N., Rijnders, G. and Ramesh, R. (2013), Ultrathin Limit of Exchange Bias Coupling at Oxide Multiferroic/Ferromagnetic Interfaces. Adv. Mater., 25: 4739–4745. doi: 10.1002/adma.201300940
- Issue online: 9 SEP 2013
- Version of Record online: 12 JUL 2013
- Manuscript Revised: 13 MAY 2013
- Manuscript Received: 28 FEB 2013
Options for accessing this content:
- If you are a society or association member and require assistance with obtaining online access instructions please contact our Journal Customer Services team.
- If your institution does not currently subscribe to this content, please recommend the title to your librarian.
- Login via other institutional login options http://onlinelibrary.wiley.com/login-options.
- You can purchase online access to this Article for a 24-hour period (price varies by title)
- If you already have a Wiley Online Library or Wiley InterScience user account: login above and proceed to purchase the article.
- New Users: Please register, then proceed to purchase the article.
Login via OpenAthens
Search for your institution's name below to login via Shibboleth.
Registered Users please login:
- Access your saved publications, articles and searches
- Manage your email alerts, orders and subscriptions
- Change your contact information, including your password
Please register to:
- Save publications, articles and searches
- Get email alerts
- Get all the benefits mentioned below!